Central Electron Microscopy Facility

Facility Personnel

For inquiries regarding electron microscopy contact:

Stephen M. King
Director
Phone: 860-679-3347
king@nso2.uchc.edu

John G. Aghajanian, Ph.D.
Assistant Director
Phone: 860-679-3157
aghajanian@nso1.uchc.edu

Maya Yankova
Research Assistant
Phone: 860-679-2395
yankova@neuron.uchc.edu

The Central Electron Microscope Facility (CEMF) is a UConn Health Center-supported research facility providing electron microscopy research service for faculty, students and extramural users. The CEMF occupies approximately 1,800 sq. ft of space on B level of the main UConn Health Center building (rooms AB027 and AB031). The CEMF has two transmission electron microscopes (TEMs), a Philips CM10 and a Hitachi H-7650 equipped with a digital camera, and a JEOL 6320F high-resolution field emission scanning electron microscope (SEM). Sample preparation instruments include ultramicrotomes, vacuum evaporator, sputter coater, critical point dryer and ion beam coater. The electron microscopes and other instruments also are available for use by experienced faculty or students. Training is available on an individual basis or in a formal graduate course offered every other year.

Services Available

  • Complete processing, examination and photography of TEM (thin-sections) and SEM specimens negative staining
  • Negative staining of particulate samples
  • Cryosectioning
  • Immunofluorescence and immunogold labeling
  • Freeze-fracture
  • Rotary shadow

Electron Microscopy Fee Schedule

The indicated prices are the in-house rates for investigators at the UConn Health Center. Please inquire for rates for external users.

One Sample

Each Additional

TEM (Complete Processing) $210 $98
SEM (Biological) $259 $95
SEM (Non-Biological) $161 $84
Negative Stain $126 $74
TEM Immunogold Label $245 $126
Freeze-Fracture $410 $210
Rotary Shadow $190 $85
TEM/SEM Instrument Time $55 per hour
TEM/SEM with Operator $90 per hour
Other Instruments $10 per hour
Instruction $35 per hour
Other Services please inquire